News & Events

IPTE presents Easy-Test-Handler at SMT in Nuremberg

IPTE is represented with its Easy-Test-Handler ETH at the booth of CheckSum in hall 7A, at this year’s SMT from May 5th to 7th in Nuremberg.

 

In-Circuit- or functional- test as well as programming processes can be inline automated with IPTE’s Easy-Test-Handler ETH. The ETH is practical for the use with single-circuit boards, multiple boards or corresponding carriers for circuit boards. Both, one- or double-sided fixtures can be realized. The fixtures can be changed quickly and easily. For optional parallel use of more than one Test-Handler, the Test-Handler can be equipped with a bypass-segment. This allows a constant production process, which is not interrupted by the testing process. Moreover, the Bypass can be used to optimize the cycle time.

 

The IPTE Easy-Test-Handler ETH is an economical test solution with compact footprint. The Easy Test Handler integrates easily in a fully automated SMEMA-compatible test environment and provides enough space for 19 inch-Test-Equipment (10 HE). The integrated LC-touch display gives access to all parameters and settings.


SearchMenu