The MFT Multi-Functional Test handler 'Bridge' is a bridge-type handler for performing in-circuit tests (Key Sight, Teradyne, Aeroflex, DigitalTest and others) on PCBs that are routed through the handler on transport belts. The clearance beneath the handler is reserved space for the tester. The most important benefit is its concept. The modular design of the bridge offers multi-functional possibilities for test handling.
Its multi-functionality lies in the fact that the modular MFT provides a single lane, dual lane, single segment, dual segment, single well and dual well configuration, thus allowing up to four times increase in throughput in comparison with a standard single lane tester. Due to the build-in dual lane the MFT-bridge can even replace full parallel test lines. The MFT concept consumes less footprint in comparison with traditional equipment.
The modular design of the MFT Multi-Functional Handler offers multifunctional possibilities for test handling. The modularity relates mainly to the following three factors:
o the number of lanes in the transport. By installing an extra lane, the throughput can be doubled. An increase of transport lanes will require an extra ball screw in driving the press-on plate
o the number of segments in each transport section. Doubling the number of segments will decrease the cycle time
o the number of ball screws in the drive of the press-on plate. By installing a supplementary ball screw, the press-down force is increased and a second PCB can be tested simultaneously with the first one.
Additionally, a bypass can be installed in the middle transport section. It offers the possibility to put the handler in pass-through mode while a PCB is being tested or to test a second PCB simultaneously with the first one. As an option, the transport section can be equipped with an automatic width-adjustment module that adjusts the position of the rear transport rail to the width of the PCB.
The MFT Multi-Functional Test handler can be integrated in a fully automated SMEMA-compatible test environment.
- Automatic in-line ICT test handler
- Single stage, dual stage and double sided contacting
- Optimized footprint for parallel testing
- Flexible in-line solutions
- Multifunctional test handling
- Easy fixture exchange