IPTE's solar inspection systems are designed for fast in-line and automatic inspection of solar wafers and/or cells.
- In-line inspection solution.
- Small footprint.
- High throughput time: single lane: up to 1200cph to 3600cph.
- Optical cell inspections such as Microcracks, SiN coating, print inspection, colour uniformity.
- Wafer inspections such as lifetime, emitter sheet resistance and resistivity/thickness.